Ellipsometric measurements on plasma deposited “diamondlike” amorphous carbon (a-C:H) films were taken in the visible, (E = 1.75 to 3.5 eV). The films were deposited on Si and their properties were varied using high temperature (up to 750 °C) anneals. The real (n) and imaginary (k) parts of the complex index of refraction N were obtained simultaneously. Following the theory of Forouhi and Bloomer (Phys. Rev. B34, 7018 (1986)), a least squares fit was used to find the dispersion relations n(E) and k(E). Reasonably good fits were obtained, showing that the theory can be used for a-C:H films. Morever, the value of the energy gap Eg obtained in this way was compared to the Eg value using conventional Tauc plots and reasonably good agreement was obtained.